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[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Investigation of Thermal Neutron Induced Soft Error Rates in Commercial Srams with 0.35 μm to 90 nm Technologies
Olmos, Marcos, Gaillard, Remi, Overberghe, Andreas, Beaucour, Jerome, Wen, Shijie, Chung, SungYear:
2006
Language:
english
DOI:
10.1109/relphy.2006.251219
File:
PDF, 299 KB
english, 2006