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[IEEE 2010 IEEE International Conference on Consumer Electronics (ICCE 2010) - Las Vegas, NV (2010.01.9-2010.01.13)] 2010 Digest of Technical Papers International Conference on Consumer Electronics (ICCE) - Block artifact reduction scheme using pseudo-random noise mask
HakSop Song,, SeonMi Park,, KiWon Yoo,Year:
2010
DOI:
10.1109/icce.2010.5418983
File:
PDF, 361 KB
2010