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[IEEE 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Bangalore, India (2007.07.11-2007.07.13)] 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Proof-of-Concept Structure for Investigation of Successive Soft Gate Oxide Breakdowns in Two Dimensions
Kaczer, B., Fernandez, R., Nackaert, A., Chiarella, T., Groeseneken, G.Year:
2007
Language:
english
DOI:
10.1109/ipfa.2007.4378063
File:
PDF, 3.88 MB
english, 2007