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[IEEE 11th International Conference on Ion Implantation Technology - Austin, TX, USA (16-21 June 1996)] Proceedings of 11th International Conference on Ion Implantation Technology - The lifetime distribution of excess carriers in H/sup +/ ion implanted silicon by photoconductive frequency resolved spectroscopy
Niby, M.A., Daiqing Li,, Lourenco, M.A., Nejim, A., Homewood, K.P., Hemment, P.L.F.Year:
1997
Language:
english
DOI:
10.1109/iit.1996.586494
File:
PDF, 318 KB
english, 1997