![](/img/cover-not-exists.png)
[IEEE 2010 Radiation Effects Data Workshop - denver, CA, USA (2010.07.20-2010.07.23)] 2010 IEEE Radiation Effects Data Workshop - Performance of Commercial Off-the-Shelf Microelectromechanical Systems Sensors in a Pulsed Reactor Environment
Holbert, Keith E., Heger, A. Sharif, McCready, Steven S.Year:
2010
Language:
english
DOI:
10.1109/redw.2010.5619509
File:
PDF, 360 KB
english, 2010