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[IEEE IEEE European Test Workshop, 2001. - Stockholm, Sweden (May 29 - Jun. 1, 2001)] IEEE European Test Workshop, 2001. - Reducing analogue fault-simulation time by using ifigh-level modelling in dotss for an industrial design
Liquan Fang,, Gronthoud, G., Kerkhoff, H.G.Year:
2001
Language:
english
DOI:
10.1109/etw.2001.946663
File:
PDF, 649 KB
english, 2001