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[IEEE 2009 IEEE International Symposium on Electromagnetic Compatibility - EMC 2009 - Austin, TX, USA (2009.08.17-2009.08.21)] 2009 IEEE International Symposium on Electromagnetic Compatibility - An analytical study on the relationship between the surface conditions of the rotary slide contacts and the noise waveforms
Mutoh, Atsuo, Nitta, Shuichi, Koyama, ReikoYear:
2009
Language:
english
DOI:
10.1109/isemc.2009.5284674
File:
PDF, 764 KB
english, 2009