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Effect of post oxidation anneal on VUV radiation-hardness of the Si/SiO/sub 2/ system studied by positron annihilation spectroscopy
Clement, M., de Nijs, J.M.M., van Veen, A., Schut, H., Balk, P.Volume:
42
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.488770
Date:
January, 1995
File:
PDF, 981 KB
english, 1995