[IEEE 2008 Twenty-fourth Annual IEEE Semionductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2008.03.16-2008.03.20)] 2008 Twenty-fourth Annual IEEE Semionductor Thermal Measurement and Management Symposium - Radially Oscillating Flow Hybrid Cooling System for Low Profile Electronics Applications
Walchli, R., Linderman, R., Brunschwiler, T., Kloter, U., Rothuizen, H., Bieri, N., Poulikakos, D., Michel, B.Year:
2008
Language:
english
DOI:
10.1109/stherm.2008.4509381
File:
PDF, 1.86 MB
english, 2008