![](/img/cover-not-exists.png)
[IEEE 2009 Seventh International Conference on Advances in Pattern Recognition (ICAPR) - Kolkata, West Bengal, India (2009.02.4-2009.02.6)] 2009 Seventh International Conference on Advances in Pattern Recognition - The Combination of Three Statistical Methods for Visual Inspection of Anomalies in Hyperspectral Imageries
Alonso, Maria C., Malpica, José A.Year:
2009
Language:
english
DOI:
10.1109/icapr.2009.78
File:
PDF, 685 KB
english, 2009