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[IEEE Sixth International Symposium on Quality of Electronic Design (ISQED'05) - San Jose, CA, USA (21-23 March 2005)] Sixth International Symposium on Quality of Electronic Design (ISQED'05) - Analysis and Optimization of Static Power Considering Transition Dependency of Leakage Current in VLSI Circuits
Abdollahi, A., Fallah, F., Pedram, M.Year:
2005
Language:
english
DOI:
10.1109/ISQED.2005.18
File:
PDF, 158 KB
english, 2005