[IEEE Sixth International Symposium on Quality of...

  • Main
  • [IEEE Sixth International Symposium on...

[IEEE Sixth International Symposium on Quality of Electronic Design (ISQED'05) - San Jose, CA, USA (21-23 March 2005)] Sixth International Symposium on Quality of Electronic Design (ISQED'05) - Analysis and Optimization of Static Power Considering Transition Dependency of Leakage Current in VLSI Circuits

Abdollahi, A., Fallah, F., Pedram, M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2005
Language:
english
DOI:
10.1109/ISQED.2005.18
File:
PDF, 158 KB
english, 2005
Conversion to is in progress
Conversion to is failed