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[IEEE Device Research Conference. Conference Digest - Notre Dame, IN, USA (25-27 June 2001)] Device Research Conference. Conference Digest (Cat. No.01TH8561) - Computer analysis of geometry and strain effects in silicon nano-crystal floating-gate flash memory devices
Thean, A., Leburton, J.-P.Year:
2001
Language:
english
DOI:
10.1109/drc.2001.937876
File:
PDF, 157 KB
english, 2001