Silicon strip detector applied to X-ray diffractometer:...

Silicon strip detector applied to X-ray diffractometer: Angular resolution and counting rate

Jacek Słowik, Andrzej Zięba
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Volume:
551
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.nima.2005.07.043
File:
PDF, 205 KB
english, 2005
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