Application of the Si-strip detector in X-ray...

Application of the Si-strip detector in X-ray crystallographic texture measurements

L. Tarkowski, J. Bonarski, W. Dabrowski
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Volume:
551
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.nima.2005.07.050
File:
PDF, 357 KB
english, 2005
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