Novel X-ray diffraction microscopy technique for measuring...

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 2005 Vol. 551; Iss. 1

Novel X-ray diffraction microscopy technique for measuring textured grains of thin-films

J.M. Yi, J.H. Je, Y.S. Chu, W.G. Cullen, H. You
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Volume:
551
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.nima.2005.07.064
File:
PDF, 257 KB
english, 2005
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