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[IEEE 2008 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2008.06.15-2008.06.16)] 2008 IEEE Silicon Nanoelectronics Workshop - Characterization of a single resonant charge in a silicon nanowire device
Pierre, M., Jehl, X., Sanquer, M., Vinet, M., Molas, G., Deleonibus, S.Year:
2008
Language:
english
DOI:
10.1109/snw.2008.5418458
File:
PDF, 1.38 MB
english, 2008