Usage of Laser Timing Probe for Sensing of Programmed Charges in EEPROM Devices
Bidani, Liron, Baharav, Oded, Sinvani, Moshe, Zalevsky, ZeevVolume:
14
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2013.2272218
Date:
March, 2014
File:
PDF, 1.09 MB
english, 2014