[IEEE IEEE 1995 Custom Integrated Circuits Conference - Santa Clara, CA, USA (1-4 May 1995)] Proceedings of the IEEE 1995 Custom Integrated Circuits Conference - High-level hot carrier reliability-driven synthesis using macro-models
Karnik, T., Chin-Chi Teng,, Sung-Mo Kang,Year:
1995
Language:
english
DOI:
10.1109/cicc.1995.518138
File:
PDF, 379 KB
english, 1995