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[IEEE 2010 International Conference on Microelectronics (ICM) - Cairo, Egypt (2010.12.19-2010.12.22)] 2010 International Conference on Microelectronics - Analytical modeling and simulation studies of high voltage super-junction drift layer for power MOSFET
Kondekar, Pravin NYear:
2010
Language:
english
DOI:
10.1109/icm.2010.5696198
File:
PDF, 972 KB
english, 2010