[IEEE 2010 Second International Conference on Modeling, Simulation and Visualization Methods (WMSVM) - Sanya, China (2010.05.15-2010.05.16)] 2010 Second International Conference on Modeling, Simulation and Visualization Methods - Image Analysis Based Measurement and Calculation of Fractal Characteristic of Pore Structure of Peanut Cake
Xiao, Zheng, Guoxiang, Lin, Jingzhou, Wang, Nong, Wan, Dongping, HeYear:
2010
Language:
english
DOI:
10.1109/wmsvm.2010.26
File:
PDF, 4.18 MB
english, 2010