Degradation of Memory Retention Characteristics in DRAM...

IEEE Electron Device Letters 2013 / 08 Vol. 34; Iss. 8

Degradation of Memory Retention Characteristics in DRAM Chip by Si Thinning for 3-D Integration

Lee, Kangwook, Tanikawa, Seiya, Murugesan, Mariappine, Naganuma, Hideki, Shimamoto, Haro, Fukushima, Takafumi, Tanaka, Tetsu, Koyanagi, Mitsumasa
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Volume:
34
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2013.2265336
Date:
August, 2013
File:
PDF, 498 KB
english, 2013
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