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[IEEE 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record - Vancouver, BC, Canada (16-20 July 2001)] 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588) - Single event upset test results on a prescaler fabricated in IBM's 5HP silicon germanium heterojunction bipolar transistors BiCMOS technology
Reed, R.A., Marshall, P.W., Ainspan, H., Marshall, C.J., Kim, H.S., Cressler, J.D., Guofu Niu,, LaBel, K.A.Year:
2001
Language:
english
DOI:
10.1109/redw.2001.960469
File:
PDF, 318 KB
english, 2001