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[IEEE Comput. Soc 18th IEEE VLSI Test Symposium - Montreal, Que., Canada (30 April-4 May 2000)] Proceedings 18th IEEE VLSI Test Symposium - Silicon-on-insulator technology impacts on SRAM testing
Adams, R.D., Shephard, P.Year:
2000
DOI:
10.1109/vtest.2000.843825
File:
PDF, 198 KB
2000