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[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - The Dynamic Current Distribution of a Multi-Fingered GGNMOS Under High Current Stress and HBMESD Events
Lee, Jian-hsing, Wu, Kuo-ming, Huang, Shao-chang, Tang, Chin-hsinYear:
2006
Language:
english
DOI:
10.1109/relphy.2006.251296
File:
PDF, 269 KB
english, 2006