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[ESD Assoc Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 - Orlando, FL, USA (28-30 Sept. 1999)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396) - Developing a transient induced latch-up standard for testing integrated circuits
Kelly, M., Henry, L.G., Barth, J., Weiss, G., Chaine, M., Gieser, H., Bonfert, D., Meuse, T., Gross, V., Hatchard, C., Morgan, I.Year:
1999
Language:
english
DOI:
10.1109/eosesd.1999.819004
File:
PDF, 1.00 MB
english, 1999