Finite Element Analysis of Inductor Core Loss Under DC Bias Conditions
Mu, Mingkai, Zheng, Feng, Li, Qiang, Lee, Fred C.Volume:
28
Language:
english
Journal:
IEEE Transactions on Power Electronics
DOI:
10.1109/tpel.2012.2235465
Date:
September, 2013
File:
PDF, 966 KB
english, 2013