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[IEEE 2011 IEEE International Technology Management Conference (ITMC) - San Jose, CA, USA (2011.06.27-2011.06.30)] First International Technology Management Conference - When to commit to a prior technological entry: A multi-theoretical view on follow-up patenting
Hsueh-Liang Wu,, Cheng-Yu Lee,, Jung-Ching Lin,Year:
2011
Language:
english
DOI:
10.1109/itmc.2011.5995951
File:
PDF, 239 KB
english, 2011