Calibration and characterization of semiconductor X-ray...

Calibration and characterization of semiconductor X-ray detectors with synchrotron radiation

M. Krumrey, M. Gerlach, F. Scholze, G. Ulm
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
568
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.nima.2006.06.004
File:
PDF, 270 KB
english, 2006
Conversion to is in progress
Conversion to is failed