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[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Trapped Charge Distribution during the P/E Cycling of SONOS Memory
Pang, Huiqing, Pan, Liyang, Sun, Lei, Wu, Dong, Zhu, JunYear:
2006
Language:
english
DOI:
10.1109/ipfa.2006.251003
File:
PDF, 3.81 MB
english, 2006