[IEEE 2007 International Semiconductor Conference (CAS 2007) - Sinaia, Romania (2007.10.15-2007.09.17)] 2007 International Semiconductor Conference - Calculation of the Depletion Region Width and Barrier Capacitance of Diffused Semiconductor Junctions with Application to Reach-Through Breakdown Voltage of Semiconductor Devices with Diffused Base
Cristea, Miron J.Year:
2007
Language:
english
DOI:
10.1109/smicnd.2007.4519765
File:
PDF, 1.34 MB
english, 2007