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[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Improving Precision Using Mixed-level Fault Diagnosis
Amyeen, M., Nayak, Debashis, Venkataraman, SrikanthYear:
2006
Language:
english
DOI:
10.1109/test.2006.297661
File:
PDF, 9.35 MB
english, 2006