Advanced Energetic and Lateral Sensitive Charge Pumping...

IEEE Transactions on Device and Materials Reliability 2008 / 09 Vol. 8; Iss. 3

Advanced Energetic and Lateral Sensitive Charge Pumping Profiling Methods for MOSFET Device Characterization—Analytical Discussion and Case Studies

Aichinger, Thomas, Nelhiebel, Michael
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Volume:
8
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2008.2002352
Date:
September, 2008
File:
PDF, 637 KB
english, 2008
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