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[IEEE IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (7-11 July 2003)] Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003 - Application of IR-OBIRCH to the failure analysis of CMOS integrated circuits
Soon, L., Ling, D.T.M., Kuan, M., Kwong Weng Yee,, Cheong, D., Zhang, G.Year:
2003
Language:
english
DOI:
10.1109/ipfa.2003.1222744
File:
PDF, 699 KB
english, 2003