[IEEE 2008 International Conference on High Voltage Engineering and Application (ICHVE) - Chongqing, China (2008.11.9-2008.11.12)] 2008 International Conference on High Voltage Engineering and Application - Study of Thermal-runaway tests on Insulators subjected to DC voltages
Muralidhara, V., Ramachandra, B., Vasudev, N., Nambudiri, P. V. Vasudevan, Ravi, K. N., Sriramulu,Year:
2008
Language:
english
DOI:
10.1109/ICHVE.2008.4773865
File:
PDF, 335 KB
english, 2008