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[IEEE VTC-2005-Fall. 2005 IEEE 62nd Vehicular Technology Conference, 2005. - Dallas, TX, USA (25-28 Sept., 2005)] VTC-2005-Fall. 2005 IEEE 62nd Vehicular Technology Conference, 2005. - On the correlated weibull fading model and its applications
Sagias, N.C., Karagiannidis, G.K., Bithas, P.S., Mathiopoulos, P.T.Volume:
4
Year:
2005
Language:
english
DOI:
10.1109/vetecf.2005.1558500
File:
PDF, 286 KB
english, 2005