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[IEEE 2003 IEEE LEOS Annual Meeting Conference Proceedings - Tucson, AZ, USA (27-28 Oct. 2003)] The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003. - Optical tools and techniques for failure analysis of modern integrated circuits
Cole, E.I., Bruce, M.R., Barton, D.L., Tangyunyong, P., Bruce, V.J., Hawkins, C.F., Soden, J.M., Henderson, C.L., Ring, R.M., Chong, W.-L., Eppes, D.H., Wilcox, J., Benson, D.A.Volume:
2
Year:
2003
Language:
english
DOI:
10.1109/LEOS.2003.1252911
File:
PDF, 168 KB
english, 2003