[IEEE 2012 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Design, Automation and Test - Peak wake-up current estimation at gate-level with standard library information
Lee, Mu-Shun Matt, Yi-Chu Liu,, Wan-Rong Wu,, Liu, Chien-Nan JimmyYear:
2012
Language:
english
DOI:
10.1109/vlsi-dat.2012.6212629
File:
PDF, 485 KB
english, 2012