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[IEEE 2012 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Design, Automation and Test - Peak wake-up current estimation at gate-level with standard library information

Lee, Mu-Shun Matt, Yi-Chu Liu,, Wan-Rong Wu,, Liu, Chien-Nan Jimmy
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Year:
2012
Language:
english
DOI:
10.1109/vlsi-dat.2012.6212629
File:
PDF, 485 KB
english, 2012
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