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[IEEE 2008 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) - Atlanta, GA, USA (2008.06.17-2008.04.17)] 2008 IEEE Radio Frequency Integrated Circuits Symposium - Scalable statistical measurement and estimation of a mmWave CML static divider sensitivity in 65nm SOI CMOS
Kim, Daeik D., Choongyeun Cho,, Jonghae Kim,Year:
2008
Language:
english
DOI:
10.1109/rfic.2008.4561515
File:
PDF, 437 KB
english, 2008