[IEEE 2014 IEEE 26th International Symposium on Power...

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[IEEE 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Waikoloa, HI, USA (2014.6.15-2014.6.19)] 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Controllability of switching speed and loss for SiC JFET/Si MOSFET cascode with external gate resistor

Shimizu, Haruka, Akiyama, Satoru, Yokoyama, Natsuki, Inomata, Hisao, Kobayashi, Hiroyoshi, Fujiki, Atsushi, Iijima, Tetsuo, Tomiyama, Kiyotaka, Sasaki, Yasushi, Ibori, Satoshi
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Year:
2014
Language:
english
DOI:
10.1109/ispsd.2014.6856016
File:
PDF, 957 KB
english, 2014
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