Neutron-induced soft error rate measurements in...

Neutron-induced soft error rate measurements in semiconductor memories

Kenan Ünlü, Vijaykrishnan Narayanan, Sacit M. Çetiner, Vijay Degalahal, Mary J. Irwin
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Volume:
579
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.nima.2007.04.049
File:
PDF, 372 KB
english, 2007
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