Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
2007 Vol. 579; Iss. 1
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Neutron-induced soft error rate measurements in semiconductor memories
Kenan Ünlü, Vijaykrishnan Narayanan, Sacit M. Çetiner, Vijay Degalahal, Mary J. IrwinVolume:
579
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.nima.2007.04.049
File:
PDF, 372 KB
english, 2007