Radiation hardness studies of VCSELs and PINs for the...

Radiation hardness studies of VCSELs and PINs for the opto-links of the Atlas SemiConductor Tracker

M.L. Chu, S. Hou, T. Huffman, C. Issever, S.C. Lee, R.S. Lu, D.S. Su, P.K. Teng, A.R. Weidberg
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Volume:
579
Year:
2007
Language:
english
Pages:
6
DOI:
10.1016/j.nima.2007.05.298
File:
PDF, 425 KB
english, 2007
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