A General Yield Model From Design to Product Engineering

IEEE Transactions on Semiconductor Manufacturing 2009 / 11 Vol. 22; Iss. 4

A General Yield Model From Design to Product Engineering

Muller-L, G.E.
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Volume:
22
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/tsm.2009.2032259
Date:
November, 2009
File:
PDF, 1.16 MB
english, 2009
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