[IEEE 2014 10th European Workshop on Microelectronics Education (EWME) - Tallinn, Estonia (2014.5.14-2014.5.16)] 10th European Workshop on Microelectronics Education (EWME) - Mixed diagnostic tests as innovation approach in VLSI engineering education
Yankovskaya, AnnaYear:
2014
Language:
english
DOI:
10.1109/ewme.2014.6877429
File:
PDF, 645 KB
english, 2014