[IEEE 2007 18th International Zurich Symposium on Electromagnetic Compatibility - Munich, Germany (2007.09.24-2007.09.28)] 2007 18th International Zurich Symposium on Electromagnetic Compatibility - Using neural networks for predicting the integrated circuits susceptibility to conducted electromagnetic disturbances
Chahine, Imad, Kadi, Moncef, Gaboriaud, Eric, Louis, Anne, Mazari, BelahceneYear:
2007
Language:
english
DOI:
10.1109/EMCZUR.2007.4388184
File:
PDF, 444 KB
english, 2007