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[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Asymmetric issues of FinFET device after hot carrier injection and impact on digital and analog circuits
Chenyue Ma,, Hao Wang,, Xiufang Zhang,, He, Frank, Yadong He,, Xing Zhang,, Xinnan Lin,Year:
2010
Language:
english
DOI:
10.1109/isqed.2010.5450542
File:
PDF, 549 KB
english, 2010