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[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - Higher than Nyquist test waveform synthesis and digital phase noise injection using time-interleaved mixed-mode data converters
Wang, Xian, Choi, Hyun Woo, Moon, Thomas, Tzou, Nicholas, Chatterjee, AbhijitYear:
2012
Language:
english
DOI:
10.1109/test.2012.6401538
File:
PDF, 475 KB
english, 2012