[IEEE Comput. Soc 19th IEEE VLSI Test Symposium. VTS 2001 - Marina Del Rey, CA, USA (29 April-3 May 2001)] Proceedings 19th IEEE VLSI Test Symposium. VTS 2001 - Fault equivalence identification using redundancy information and static and dynamic extraction
Amyeen, M.E., Fuchs, W.K., Pomeranz, I., Boppana, V.Year:
2001
Language:
english
DOI:
10.1109/vts.2001.923428
File:
PDF, 715 KB
english, 2001