[IEEE Fifth International Conference on Solid-State and Integrated Circuit Technology-ICSICT'98 - Beijing, China (21-23 Oct. 1998)] 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105) - Technique and instrument for the characterization of deep traps in GaAs MESFET structures
Gorev, N.B., Kodzespirova, I.F., Kostylev, S.A., Kovalenko, Yu.A., Prokhorov, E.F.Year:
1998
Language:
english
DOI:
10.1109/icsict.1998.785978
File:
PDF, 159 KB
english, 1998