Discriminant analysis and secondary-beam charge recognition

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 2008 Vol. 587; Iss. 2-3

Discriminant analysis and secondary-beam charge recognition

J. Łukasik, P. Adrich, T. Aumann, C.O. Bacri, T. Barczyk, R. Bassini, S. Bianchin, C. Boiano, A.S. Botvina, A. Boudard, J. Brzychczyk, A. Chbihi, J. Cibor, B. Czech, J.-É. Ducret, H. Emling, J. Frankl
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Volume:
587
Year:
2008
Language:
english
Pages:
7
DOI:
10.1016/j.nima.2008.01.071
File:
PDF, 537 KB
english, 2008
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