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[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - Board assisted-BIST: Long and short term solutions for testpoint erosion — Reaching into the DFx toolbox
Conroy, Zoe, Grealish, James, Miles, Harrison, Suto, Anthony J., Crouch, Alfred, Meyers, SkipYear:
2012
Language:
english
DOI:
10.1109/test.2012.6401572
File:
PDF, 804 KB
english, 2012